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LPCOpen Platform for LPC18XX/43XX microcontrollers
18XX43XX
LPCOpen Platform for the NXP LPC18XX/43XX family of Microcontrollers
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Memory test address/size and result structure.
Definition at line 47 of file mem_tests.h.
#include "mem_tests.h"
Data Fields | |
| uint32_t * | start_addr |
| uint32_t | bytes |
| uint32_t * | fail_addr |
| uint32_t | is_val |
| uint32_t | ex_val |
| uint32_t bytes |
Size in bytes for memory test
Definition at line 49 of file mem_tests.h.
| uint32_t ex_val |
Expected value of test (returned only if failed)
Definition at line 52 of file mem_tests.h.
| uint32_t* fail_addr |
Failed address of test (returned only if failed)
Definition at line 50 of file mem_tests.h.
| uint32_t is_val |
Failed value of test (returned only if failed)
Definition at line 51 of file mem_tests.h.
| uint32_t* start_addr |
Starting address for memory test
Definition at line 48 of file mem_tests.h.
1.8.3.1